XAFS studies of nickel-doped lead telluride
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چکیده
منابع مشابه
XAFS studies of nickel-doped lead telluride
The problem of impurities and defect states in lead telluride-based semiconductors is of crucial importance for their practical applications. X-ray absorption fine structure (XAFS) techniques are capable to address some of the key issues regarding impurities position, their valent state, as well as the local structural changes of the host lattice in the immediate surrounding of the impurity ato...
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ژورنال
عنوان ژورنال: Physica B: Condensed Matter
سال: 2009
ISSN: 0921-4526
DOI: 10.1016/j.physb.2009.08.209